GRAZing Incidence X-ray Ptychographic MicroscopY - GRAZY

Imaging and tomography at the nanoscale are inherently challenged when required to answer scientific questions in materials science with statistical significance as severe limitations are imposed because the attainable spatial resolution is coupled to the field of view. No techniques provide real-space nanoscale resolution while allowing probing of mm-sized areas or volumes. This is a well-known limitation when attempting to draw statistically significant conclusions about nanostructured materials from microscopy. Typically areas and volumes are sequentially scanned to stitch together a larger field of view, which significantly increases acquisition times, prohibiting otherwise desirable in situ experiments. We propose to develop a technique that achieves much faster coverage of large fields of view by allowing the relaxation of spatial resolution in one or two dimensions, while providing nanoscale resolution in the other, opening new areas of in situ experiments that could revolutionize materials science.