Developing ultrahigh spatial and temporal resolution microscopy to probe quantum features in moiré superlattices

Quantum technologies have the potential to provide enormous advancements in massive applications, including ultra-secure communications, highly sensitive metrology, and super-fast computing. Developing high-quality III-V materials and various superconductors for quantum technologies primarily uses molecular beam epitaxy. Recently, stacking and twisting 2D van der Waals layered materials has revolutionized designer quantum materials. However, due to the small moiré period, exploring and understanding quantum features in individual moiré units remains unexplored. This project aims at developing a novel scattering-based scanning near-field optical microscope (s-SNOM) to achieve excellent spatial (~2 nm) and temporal (~100 fs) resolution, to investigate quantum features in the moiré superlattices. The technology developed in this project will trigger a new generation of near-field scanning microscopes and pave the way to explore quantum world if successful.